Measurement of Single-Event Upsets in 65-nm SRAMs Under Irradiation of Spallation Neutrons at J-PARC MLF
Measurement of Single-Event Upsets in 65-nm SRAMs Under Irradiation of Spallation Neutrons at J-PARC MLF
Measurement of Ambient Magnetic Field Noise for Through-the-Earth (TTE) Communications and Historical Comparisons